Podrobnosti návrhu
| Název | Amendment 2 - Measurement procedures for materials used in photovoltaic modules - Part 1-4: Encapsulants - Measurement of optical transmittance and calculation of the solar-weighted photon transmittance, yellowness index, and UV cut-off wavelength |
|---|---|
| Číslo | 82/2619/CDV - IEC 62788-1-4/AMD2 ED1 |
| Zdroj | ISO\IEC\CEN\CENELEC |
| Komise | IEC/TC 82 (Solar photovoltaic energy systems) |
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Akce
Anotace
Replace the text “The change in transmittance, yellowness index, and ultraviolet (UV) cut-off wavelength may be used by encapsulation or module manufacturers to compare the durability of different materials.” by the following:
“The change in transmittance (or reflectance), yellowness index, and ultraviolet (UV) cut-off wavelength may be used by encapsulation or module manufacturers to compare the durability of different materials.”
Replace the text “This part of IEC 62788 provides a method for measurement of the optical transmittance of encapsulation materials used in photovoltaic (PV) modules. The standardized measurements in this procedure quantify the expected transmittance of the encapsulation to the PV cell. Subsequent calculation of solar-weighted transmittance allows for comparison between different materials. The results for unweathered material may be used in an encapsulation manufacturer’s datasheets, in manufacturer’s material or process development, in manufacturing quality control (material acceptance), or applied in the analysis of module performance.
This measurement method can also be used to monitor the performance of encapsulation materials after weathering, to help assess their durability. The standardized measurements are intended to examine an interior region within a PV module, e.g., without the effects of oxygen diffusion at the periphery of the cells. Subsequent calculation of yellowness index allows for quantification of durability and consideration of appearance. The change in transmittance, yellowness index, and ultraviolet (UV) cut-off wavelength may be used by encapsulation or module manufacturers to compare the durability of different materials.” by the following:
“This part of IEC 62788 provides a method for measurement of the optical performance of encapsulation materials used in photovoltaic (PV) modules. For transparent encapsulant(s), the standardized measurements in this procedure quantify the expected transmittance of the encapsulant(s) available to the PV cell. For opaque encapsulants (e.g., black or white), the standardized measurements in this procedure quantify the expected reflectance of the encapsulant. The methods in this standard are described for total luminance (hemispherical light, for transmittance or reflectance obtained using an integrating sphere). While the methods in this standard may also be used for direct and diffuse light, these are outside the scope of ordinary use of this standard. Subsequent calculation of solar-weighted optical performance allows for comparison between different materials. The results for unaged material may be used in an encapsulant manufacturer’s datasheets, in manufacturer’s material or process development, in manufacturing quality control (material acceptance), or applied in the analysis of module performance.
This measurement method can also be used to monitor the performance of encapsulation materials after weathering, to help assess their durability. The standardized measurements are intended to examine an interior region within a PV module, e.g., without the effects of oxygen diffusion at the periphery of the cells. Subsequent calculation of yellowness index allows for quantification of durability and consideration of appearance. The change in transmittance (or reflectance), yellowness index, and ultraviolet (UV) cut-off wavelength may be used by encapsulant or module manufacturers to compare the durability of different materials.”
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